| Scanning – Dynamic Absorbance Detection
– D A D |
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| Wavelength Range |
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190-700nm |
| Optical Bandwidth |
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4nm – constant |
| Digital Resolution |
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1nm |
| Wavelength Accuracy |
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1nm |
| Wavelength Reproducibility |
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± 0.1nm |
| Absorbance Range |
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0.001 to 3A |
| Scan Speeds |
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Up to 1000nm/s – UV scan in 200ms |
| Baseline Flatness |
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± 0.002A over most of range |
| Second Order Filter |
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Fast automatic insertion at 370nm |
| Noise |
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< ± 0.7 x 10–5 A, 230nm, 2 s T/C, using air test cell |
| Drift |
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< ±0.7 x 10–4 A/h, 230nm, at equilibrium using air test cell |
| Overlayed Scans |
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Up to 8 scans may be overlayed |
| Scan Trigger |
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At start of peak, set absorbance value, point of inflection
or at peak |
| Number of Peak Scans |
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Up to 100 peaks for a single elution |
| Scan Storage |
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Up to 100 scans password protected |
| Multiple Scans of a Peak |
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Up to 8 scans of any peak |
| Used with DataStream Software |
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Data to PC, PC control, scan triggering, Lambda max. scans,
peak purity and purity calculation, graphical presentation,
overlay, normalisation, disk storage, library store and search,
transfer to Excel etc and many other functions. |
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| Variable Wavelength Detection – V W D |
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| Wavelength Range |
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190-700nm |
| Wavelength Accuracy |
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1nm |
| Wavelength Reproducibility |
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± 0.1nm |
| Absorbance Range |
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0.001 to 3A |
| Absorbance Linearity |
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Better than 1% 0.001 – 2A |
| Optical Bandwidth |
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4nm – constant |
| Dual Wavelength Operation |
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Simultaneous measurement at 2 wavelengths and ratio |
| Wavelength Programming |
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Measurements at up to 6 different wavelengths with a time
program and selectable sensitivity |
| Noise |
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± 0.5 x 10–5 A at 230nm, 2s T/C, using air test cell |
| Drift |
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±0.3 x 10–4 A at 230nm at equilibrium, using test cell |
| Noise – Dual Wavelength |
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± 2 x 10–5 A at 250/280nm |
| Drift – Dual Wavelength |
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± 2 x 10–4 A at 250/280nm, constant temperature |
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| General Specification |
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| Optical System |
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Double Beam |
| Monochromator |
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Littrow with 1200 l/mm holographic grating |
| Straylight |
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< 0.02% p.t.p. at 220nm and 340nm |
| Detectors |
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Two Silicon Diodes |
| Lamp |
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Deuterium lamp with elapsed time indicator |
| Taper Beam Optics |
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All energy collected to minimise RI effects |
| Self Test |
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Automatic at switch-on; continuous monitoring of key functions |
| Autozero |
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By control panel or external trigger |
| Time Constant |
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0.1 sec – 10 sec, selectable |
| Wavelength Calibration |
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Automatic at switch-on using deuterium emission line. |
| Display |
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Four-line display of parameters, menus, prompts, wavelength,
absorbance etc. |
| Fast Number Entry |
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By use of special number keys |
| Event Marking |
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From keypad or by external trigger |
| Method Storage |
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For up to 30 methods, security protected |
| Automatic Power-Up/Off |
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Pre-programmed to save warm up time |
| Outputs |
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Two absorbance outputs, or absorbance and absorbance ratio.
Data available to PC. |
| Inputs |
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Event, autozero |
| Size and Weight |
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365 x 290 x 140mm, 17kg |
| Power Requirements |
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115V or 230V, 50/60Hz, 50VA |
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| PowerStream System
Requirements
- Computer with Pentium class processor
- Pentium 200 MHz or better
- Microsoft Windows XP
- Microsoft NT 4.0, service pack 3 or later
- 64 MB of RAM or more
- Hard-disk space required: 15 MB
- CD-ROM drive
- XGA or higher resolution monitor
- Monitor resolution 1024 x 768 or better
- Microsoft Mouse or compatible pointer
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